Effects of series resistance and interface properties on the operation of AlGaN/GaN high electron mobility transistors

Dae Young Jeon, Do Kywn Kim, So Jeong Park, Yumin Koh, Chu Young Cho, Gyu Tae Kim, Kyung Ho Park

    Research output: Contribution to journal › Article › peer-review

    7 Citations (Scopus)

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    Engineering