Effects of thermal annealing on the structural properties of CdZnTe crystals

  • G. Yang*
  • , A. E. Bolotnikov
  • , P. M. Fochuk
  • , Y. Cui
  • , G. S. Camarda
  • , A. Hossain
  • , K. H. Kim
  • , J. Horace
  • , B. McCall
  • , R. Gul
  • , O. V. Kopach
  • , S. U. Egarievwe
  • , R. B. James
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Although cadmium zinc telluride (CZT) is one of leading materials for fabricating room-temperature nuclear-radiation- detectors, different defects in the crystals can degrade the performance of CZT detectors. Post-growth thermal annealing potentially offers a satisfactory way to eliminate the deleterious influence of these defects. Here, we report that the annealing of CZT in Cd vapor effectively lowers the density of Te inclusions. It takes a much longer annealing time to eliminate separate large Te inclusions than small ones; however, the annealing time is greatly reduced when the large Te inclusions are distributed along grain boundaries. We found that sub-grain boundaries still exist after the annealing at 500°C, indicating that a higher annealing temperature might be needed.

Original languageEnglish
Title of host publicationHard X-Ray, Gamma-Ray, and Neutron Detector Physics XIII
DOIs
Publication statusPublished - 2011
Externally publishedYes
EventHard X-Ray, Gamma-Ray, and Neutron Detector Physics XIII - San Diego, CA, United States
Duration: 2011 Aug 222011 Aug 24

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8142
ISSN (Print)0277-786X

Conference

ConferenceHard X-Ray, Gamma-Ray, and Neutron Detector Physics XIII
Country/TerritoryUnited States
CitySan Diego, CA
Period11/8/2211/8/24

Keywords

  • CZT
  • Te inclusions
  • annealing
  • radiation detection
  • sub-grain boundaries

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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