Effects of thermal cycle annealing on reduction of defect density in lattice-mismatched InGaAs solar cells

Engineering & Materials Science

• Annealing 69%
• Buffer layers 82%
• Carrier lifetime 18%
• Chemical analysis 7%
• Defect density 100%
• Electron beams 13%
• Hot Temperature 33%
• Indium 15%
• Induced currents 14%
• Microscopic examination 12%
• Open circuit voltage 14%
• Quantum efficiency 18%
• Solar cells 74%
• Strain relaxation 19%
• Substrates 8%
• Transmission electron microscopy 11%

Physics & Astronomy

• annealing 41%
• buffers 44%
• carrier lifetime 9%
• cycles 46%
• defects 38%
• electron beams 6%
• indium 8%
• microscopy 6%
• minority carriers 9%
• open circuit voltage 8%
• quantum efficiency 7%
• solar cells 51%
• transmission electron microscopy 5%

Chemical Compounds

• Annealing 54%
• Buffer Solution 45%
• Electron Beam Induced Current 22%
• Reduction 31%
• Solar Cell 60%
• Strain 16%
• Transmission Electron Microscopy 7%
• Voltage 8%