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Dive into the research topics of 'Efficient characterization and suppression methodology of edge effects for leakage current reduction of sub-40nm DRAM device'. Together they form a unique fingerprint.- Sort by
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Han Choi Soo, Hee Park Young, Hong Park Chul, Hoon Lee Sang, Hyun Yoo Moon, Tae Kim Gyu
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution