Efficient characterization and suppression methodology of edge effects for leakage current reduction of sub-40nm DRAM device

Han Choi Soo, Hee Park Young, Hong Park Chul, Hoon Lee Sang, Hyun Yoo Moon, Tae Kim Gyu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

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Engineering & Materials Science