Electric field distribution of cadmium zinc telluride (CZT) detectors

G. Yang, A. E. Bolotnikov, G. S. Camarda, Y. Cui, A. Hossain, K. Kim, R. B. James

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

Cadmium Zinc Telluride (CZT) is attracting increasing interest with its promise as a room-temperature nuclear-radiationdetector material. The distribution of the electric field in CZT detectors substantially affects their detection performance. At Brookhaven National Laboratory (BNL), we employed a synchrotron X-Ray mapping technique and a Pockels-effect measurement system to investigate this distribution in different detectors. Here, we report our latest experimental results with three detectors of different width/height ratios. A decrease in this ratio aggravates the non-uniform distribution of electric field, and focuses it on the central volume. Raising the bias voltage effectively can minimize such nonuniformity of the electric field distribution. The position of the maximum electric field is independent of the bias voltage; the difference between its maximum- and minimum-intensity of electric field increases with the applied bias voltage.

Original languageEnglish
Title of host publicationHard X-Ray, Gamma-Ray, and Neutron Detector Physics XI
DOIs
Publication statusPublished - 2009
Externally publishedYes
EventHard X-Ray, Gamma-Ray, and Neutron Detector Physics XI - San Diego, CA, United States
Duration: 2009 Aug 32009 Aug 6

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7449
ISSN (Print)0277-786X

Conference

ConferenceHard X-Ray, Gamma-Ray, and Neutron Detector Physics XI
Country/TerritoryUnited States
CitySan Diego, CA
Period09/8/309/8/6

Keywords

  • CdZnTe
  • Electric field
  • Pockels effect
  • Radiation detection
  • X-ray mapping

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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