@inproceedings{ae6aad5915cf4e9aabc65559dc2c17d5,
title = "Electric field distribution of cadmium zinc telluride (CZT) detectors",
abstract = "Cadmium Zinc Telluride (CZT) is attracting increasing interest with its promise as a room-temperature nuclear-radiationdetector material. The distribution of the electric field in CZT detectors substantially affects their detection performance. At Brookhaven National Laboratory (BNL), we employed a synchrotron X-Ray mapping technique and a Pockels-effect measurement system to investigate this distribution in different detectors. Here, we report our latest experimental results with three detectors of different width/height ratios. A decrease in this ratio aggravates the non-uniform distribution of electric field, and focuses it on the central volume. Raising the bias voltage effectively can minimize such nonuniformity of the electric field distribution. The position of the maximum electric field is independent of the bias voltage; the difference between its maximum- and minimum-intensity of electric field increases with the applied bias voltage.",
keywords = "CdZnTe, Electric field, Pockels effect, Radiation detection, X-ray mapping",
author = "G. Yang and Bolotnikov, {A. E.} and Camarda, {G. S.} and Y. Cui and A. Hossain and K. Kim and James, {R. B.}",
year = "2009",
doi = "10.1117/12.826909",
language = "English",
isbn = "9780819477392",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
booktitle = "Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI",
note = "Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI ; Conference date: 03-08-2009 Through 06-08-2009",
}