Electrical and recombination properties and deep traps spectra in MOCVD ELOG GaN layers

In Hwan Lee, A. Y. Polyakov, N. B. Smirnov, A. V. Govorkov, A. V. Markov, S. J. Pearton

Research output: Contribution to journalConference articlepeer-review

26 Citations (Scopus)


Electrical properties, deep levels spectra, spectra of microcathodoluminescence, diffusion lengths of minority carriers were studied in undoped GaN films grown by standard metallorganic chemical vapour deposition on sapphire and by the epitaxial lateral overgrowth technique (ELOG). It is shown that the total concentrations of shallow donors and of electron and hole traps are very considerably lower in the ELOG material compared to the ordinary MOCVD samples. MCL and electron beam induced current EBIC imaging of ELOG samples suggests that the dislocation density in the overgrown regions is on the order of 106 cm-2 while in-between these regions it is similar to the dislocation density in the standard material, about 109 cm-2. Local diffusion lengths were shown to follow the same trend as dislocation densities.

Original languageEnglish
Pages (from-to)2087-2090
Number of pages4
JournalPhysica Status Solidi (C) Current Topics in Solid State Physics
Publication statusPublished - 2006
Externally publishedYes
Event6th International Conference on Nitride Semiconductors, ICNS-6 - Bremen, Germany
Duration: 2005 Aug 282005 Sept 2

ASJC Scopus subject areas

  • Condensed Matter Physics


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