Electrical and recombination properties and deep traps spectra in MOCVD ELOG GaN layers

In Hwan Lee, A. Y. Polyakov, N. B. Smirnov, A. V. Govorkov, A. V. Markov, S. J. Pearton

Research output: Contribution to journalConference articlepeer-review

27 Citations (Scopus)

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