Electrical characteristics of V/Ti/Au contacts to Ga-polar and N-polar n-gan prepared by different methods

Joon Woo Jeon, Seong Han Park, Se Yeon Jung, Jihyung Moon, June O. Song, Gon Namgoong, Tae Yeon Seong

Research output: Contribution to journalArticlepeer-review

10 Citations (Scopus)

Abstract

We have investigated the electrical properties of V (20 nm)/Ti (60 nm)/Au (20 nm) contacts to Ga- and N-polar n-GaN. Regardless of the crystal polarities, all the samples exhibit similar electrical characteristics. The as-deposited samples are ohmic. However, they become nonohmic when annealed at 300-500° C. The samples are ohmic again at 700°C. Based on the X-ray photoemission spectroscopy and Auger electron spectroscopy results, the ohmic and degradation behaviors are explained in terms of the formation of donorlike surface defects and Ga vacancies, which are generated by dry etching, the out-diffusion of Ga, and the formation of nitride phases.

Original languageEnglish
Pages (from-to)H125-H127
JournalElectrochemical and Solid-State Letters
Volume13
Issue number4
DOIs
Publication statusPublished - 2010

ASJC Scopus subject areas

  • General Chemical Engineering
  • General Materials Science
  • Physical and Theoretical Chemistry
  • Electrochemistry
  • Electrical and Electronic Engineering

Fingerprint

Dive into the research topics of 'Electrical characteristics of V/Ti/Au contacts to Ga-polar and N-polar n-gan prepared by different methods'. Together they form a unique fingerprint.

Cite this