Abstract
High purity Pb-doped CdZnTe single crystals were grown by using the vertical Bridgman method. Their electrical properties and X-ray spectrum were investigated. The doping concentration of Pb was about 1 × 1019 cm- 3. The resistivity of Pb-doped CdZnTe single crystal was 2 × 109 Ω cm. The temperature dependence of the resistivity of these crystals was examined between the region of 200 and 300 K. The plot of log (ρ) versus 1000 / T was represented by a straight line with a slope of 380 meV. From the PL spectrum, we have confirmed that type conversion from p to n-type conductivity originated from the compensation process of Cd vacancies, which are the most abundant acceptors in CdZnTe. Also, the effects of Pb-doping on the mobility and X-ray spectra were studied by time-of-flight (TOF) and 241Am spectrum measurements.
Original language | English |
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Pages (from-to) | 211-214 |
Number of pages | 4 |
Journal | Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment |
Volume | 586 |
Issue number | 2 |
DOIs | |
Publication status | Published - 2008 Feb 21 |
Keywords
- CdZnTe:Pb
- X-ray detector
- X-ray spectrum
ASJC Scopus subject areas
- Nuclear and High Energy Physics
- Instrumentation