TY - GEN
T1 - Electrical properties, deep levels spectra and luminescence of undoped GaN/InGaN multi-quantum-well structures as affected by electron irradiation
AU - Polyakov, Alexander Y.
AU - Smirnov, Nikolai B.
AU - Govorkov, Anatoliy V.
AU - Markov, Alexander V.
AU - Lee, Cheul Ro
AU - Lee, In Hwan
AU - Kolin, Nikolai G.
AU - Merkurisov, Denis I.
AU - Boiko, Vladimir M.
AU - Wright, James S.
PY - 2006
Y1 - 2006
N2 - Current-voltage, capacitance-voltage characteristics, admittance spectra, deep traps spectra (DLTS), microcathodoluminescence (MCL) spectra of undoped n-GaN/InGaN multiquantum well (MQW) structures were studied before and after 10 MeV electron irradiation. The current flow in the studied structures was found to be determined by strong tunneling while the presence of piezoelectric field manifested itself in the red spectral shift of the quantum well related peak and a marked dependence of the peak position on applied external electric field. DLTS spectra showed unusual features that could be related to transient screening of polarization charges. Electron irradiation introduced a high density of band-like states that could be due to interface traps in the MQWs.
AB - Current-voltage, capacitance-voltage characteristics, admittance spectra, deep traps spectra (DLTS), microcathodoluminescence (MCL) spectra of undoped n-GaN/InGaN multiquantum well (MQW) structures were studied before and after 10 MeV electron irradiation. The current flow in the studied structures was found to be determined by strong tunneling while the presence of piezoelectric field manifested itself in the red spectral shift of the quantum well related peak and a marked dependence of the peak position on applied external electric field. DLTS spectra showed unusual features that could be related to transient screening of polarization charges. Electron irradiation introduced a high density of band-like states that could be due to interface traps in the MQWs.
UR - http://www.scopus.com/inward/record.url?scp=40949112848&partnerID=8YFLogxK
U2 - 10.1557/proc-0955-i15-11
DO - 10.1557/proc-0955-i15-11
M3 - Conference contribution
AN - SCOPUS:40949112848
SN - 9781604234114
T3 - Materials Research Society Symposium Proceedings
SP - 375
EP - 377
BT - Advances in III-V Nitride Semiconductor Materials and Devices
PB - Materials Research Society
T2 - 2006 MRS Fall Meeting
Y2 - 27 November 2006 through 1 December 2006
ER -