Electrical properties of Cr-doped SrTiO 3 films as a switch material in ReCTF devices

Yujeong Seo, Minyeong Song, Ho Myoung An, Hee Dong Kim, Tae Geun Kim, Yun Mo Sung, Yeon Soo Kim

    Research output: Contribution to journalArticlepeer-review

    2 Citations (Scopus)

    Abstract

    The electrical properties of Cr-SrTiO 3 films deposited on p-Si(1 0 0) substrates are investigated for application to a new type of charge-trap flash memory, named ReCTF (ReRAM + CTF). The Cr-SrTiO 3 film used as a switch in a ReCTF device has a complete cubic perovskite structure with a (2 0 0) crystallographic orientation. By means of current-voltage (I-V) and capacitance-voltage (C-V) analyses, we found that it exhibited electric-field-induced threshold switching characteristics and there were no trapping effects. In this study, we investigated how the retention characteristics of the ReCTF device can be improved without any special processes by applying an optimized Cr-SrTiO 3 film.

    Original languageEnglish
    Pages (from-to)321-324
    Number of pages4
    JournalMicroelectronic Engineering
    Volume98
    DOIs
    Publication statusPublished - 2012 Oct

    Bibliographical note

    Funding Information:
    This work was supported by the Seoul R&BD program (No. ST100024) as well as the Leading Foreign Research Institute Recruitment Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education, Science and Technology (MEST) (No. 2010-00218 ). This work was also partially supported by the Samsung Semiconductor Research Center at Korea University .

    Keywords

    • C-V
    • CTF
    • I-V
    • NVMs
    • ReCTF
    • ReRAM

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Atomic and Molecular Physics, and Optics
    • Condensed Matter Physics
    • Surfaces, Coatings and Films
    • Electrical and Electronic Engineering

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