Electrical Stability of p-Channel Feedback Field-Effect Transistors under Bias Stresses

Jaemin Son, Kyoungah Cho, Sangsig Kim

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Electrical Stability of p-Channel Feedback Field-Effect Transistors under Bias Stresses'. Together they form a unique fingerprint.

Engineering & Materials Science

Chemical Compounds