Electro-optic measurement of Langmuir-Blodgett films layered with N-docosylquinolinium-TCNQ

Dong Myung Shin, Kang Hoon Choi, Dou Yol Kang, Tae Wan Kim, Dong Hoon Choi

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2 Citations (Scopus)


Electro-optic coefficient, refractive index and dielectric dispersion for the Langmuir-Blodgett (LB) films of N-docosylquinolinium-TCNQ were obtained. The thickness of one layer of the LB film was 38.14Å at the surface pressure of 30mN/m, and the refractive index calculated from spectroscopic ellipsometry was 1.2∼1.3. The dielectric dispersion shows the frequency dependence of the orientational polarization and the resonance frequency, fr, was about 1.5kHz in the film. The electro-optic effect for the LB film were measured from the simple reflection technique. Suprisingly large electro-optic coefficient, 98.7∼69.3pm/V, were obtained.

Original languageEnglish
Pages (from-to)2093-2094
Number of pages2
JournalSynthetic Metals
Issue number1-3
Publication statusPublished - 1995 Apr 1
Externally publishedYes

Bibliographical note

Funding Information:
This paper was supported by NON-DIRECT RESEARCH (01-E-1085), Korea Research Foundation, 1994.

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering
  • Metals and Alloys
  • Materials Chemistry


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