Electro-optic measurement of Langmuir-Blodgett films layered with N-docosylquinolinium-TCNQ

Dong Myung Shin; Kang Hoon Choi; Dou Yol Kang; Tae Wan Kim; Dong Hoon Choi

doi:10.1016/0379-6779(94)03182-6

Electro-optic measurement of Langmuir-Blodgett films layered with N-docosylquinolinium-TCNQ

Dong Myung Shin^*
, Kang Hoon Choi
, Dou Yol Kang
, Tae Wan Kim
, Dong Hoon Choi

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

Electro-optic coefficient, refractive index and dielectric dispersion for the Langmuir-Blodgett (LB) films of N-docosylquinolinium-TCNQ were obtained. The thickness of one layer of the LB film was 38.14Å at the surface pressure of 30mN/m, and the refractive index calculated from spectroscopic ellipsometry was 1.2∼1.3. The dielectric dispersion shows the frequency dependence of the orientational polarization and the resonance frequency, f_r, was about 1.5kHz in the film. The electro-optic effect for the LB film were measured from the simple reflection technique. Suprisingly large electro-optic coefficient, 98.7∼69.3pm/V, were obtained.

Original language	English
Pages (from-to)	2093-2094
Number of pages	2
Journal	Synthetic Metals
Volume	71
Issue number	1-3
DOIs	https://doi.org/10.1016/0379-6779(94)03182-6
Publication status	Published - 1995 Apr 1
Externally published	Yes

Bibliographical note

Funding Information:
This paper was supported by NON-DIRECT RESEARCH (01-E-1085), Korea Research Foundation, 1994.

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering
Metals and Alloys
Materials Chemistry

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@article{19eace5e391d4e2bad2530bc44e5e00f,

title = "Electro-optic measurement of Langmuir-Blodgett films layered with N-docosylquinolinium-TCNQ",

abstract = "Electro-optic coefficient, refractive index and dielectric dispersion for the Langmuir-Blodgett (LB) films of N-docosylquinolinium-TCNQ were obtained. The thickness of one layer of the LB film was 38.14{\AA} at the surface pressure of 30mN/m, and the refractive index calculated from spectroscopic ellipsometry was 1.2∼1.3. The dielectric dispersion shows the frequency dependence of the orientational polarization and the resonance frequency, fr, was about 1.5kHz in the film. The electro-optic effect for the LB film were measured from the simple reflection technique. Suprisingly large electro-optic coefficient, 98.7∼69.3pm/V, were obtained.",

author = "Shin, \{Dong Myung\} and Choi, \{Kang Hoon\} and Kang, \{Dou Yol\} and Kim, \{Tae Wan\} and Choi, \{Dong Hoon\}",

note = "Funding Information: This paper was supported by NON-DIRECT RESEARCH (01-E-1085), Korea Research Foundation, 1994.",

year = "1995",

month = apr,

day = "1",

doi = "10.1016/0379-6779(94)03182-6",

language = "English",

volume = "71",

pages = "2093--2094",

journal = "Synthetic Metals",

issn = "0379-6779",

publisher = "Elsevier B.V.",

number = "1-3",

}

TY - JOUR

T1 - Electro-optic measurement of Langmuir-Blodgett films layered with N-docosylquinolinium-TCNQ

AU - Shin, Dong Myung

AU - Choi, Kang Hoon

AU - Kang, Dou Yol

AU - Kim, Tae Wan

AU - Choi, Dong Hoon

N1 - Funding Information: This paper was supported by NON-DIRECT RESEARCH (01-E-1085), Korea Research Foundation, 1994.

PY - 1995/4/1

Y1 - 1995/4/1

N2 - Electro-optic coefficient, refractive index and dielectric dispersion for the Langmuir-Blodgett (LB) films of N-docosylquinolinium-TCNQ were obtained. The thickness of one layer of the LB film was 38.14Å at the surface pressure of 30mN/m, and the refractive index calculated from spectroscopic ellipsometry was 1.2∼1.3. The dielectric dispersion shows the frequency dependence of the orientational polarization and the resonance frequency, fr, was about 1.5kHz in the film. The electro-optic effect for the LB film were measured from the simple reflection technique. Suprisingly large electro-optic coefficient, 98.7∼69.3pm/V, were obtained.

AB - Electro-optic coefficient, refractive index and dielectric dispersion for the Langmuir-Blodgett (LB) films of N-docosylquinolinium-TCNQ were obtained. The thickness of one layer of the LB film was 38.14Å at the surface pressure of 30mN/m, and the refractive index calculated from spectroscopic ellipsometry was 1.2∼1.3. The dielectric dispersion shows the frequency dependence of the orientational polarization and the resonance frequency, fr, was about 1.5kHz in the film. The electro-optic effect for the LB film were measured from the simple reflection technique. Suprisingly large electro-optic coefficient, 98.7∼69.3pm/V, were obtained.

UR - https://www.scopus.com/pages/publications/0029288918

U2 - 10.1016/0379-6779(94)03182-6

DO - 10.1016/0379-6779(94)03182-6

M3 - Article

AN - SCOPUS:0029288918

SN - 0379-6779

VL - 71

SP - 2093

EP - 2094

JO - Synthetic Metals

JF - Synthetic Metals

IS - 1-3

ER -

Electro-optic measurement of Langmuir-Blodgett films layered with N-docosylquinolinium-TCNQ

Abstract

Bibliographical note

ASJC Scopus subject areas

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