Electron effective mean free path and thermal conductivity predictions of metallic thin films

Jae Sik Jin; Joon Sik Lee; Ohmyoung Kwon

doi:10.1063/1.2917454

Electron effective mean free path and thermal conductivity predictions of metallic thin films

Jae Sik Jin
, Joon Sik Lee
, Ohmyoung Kwon

Research output: Contribution to journal › Article › peer-review

43 Citations (Scopus)

Abstract

A simple model of the electron effective mean free path (MFP) in thin metal films is proposed, and the thermal conductivities of aluminum and copper thin films are calculated by solving the Boltzmann transport equation (BTE). In the modeling of the electron effective MFP, the combined contributions of the bulk MFP and the film MFP are taken into account. The proposed effective electron MFP model is incorporated with the gray version of BTE through the "transport" relaxation time. The present model is verified against the experimental thermal conductivity data as a function of the film thickness.

Original language	English
Article number	171910
Journal	Applied Physics Letters
Volume	92
Issue number	17
DOIs	https://doi.org/10.1063/1.2917454
Publication status	Published - 2008

Bibliographical note

Funding Information:
This work was supported by the Micro Thermal System Research Center, Seoul National University, sponsored by the Korean Science and Engineering Foundation.

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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10.1063/1.2917454

Cite this

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abstract = "A simple model of the electron effective mean free path (MFP) in thin metal films is proposed, and the thermal conductivities of aluminum and copper thin films are calculated by solving the Boltzmann transport equation (BTE). In the modeling of the electron effective MFP, the combined contributions of the bulk MFP and the film MFP are taken into account. The proposed effective electron MFP model is incorporated with the gray version of BTE through the {"}transport{"} relaxation time. The present model is verified against the experimental thermal conductivity data as a function of the film thickness.",

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AU - Jin, Jae Sik

AU - Lee, Joon Sik

AU - Kwon, Ohmyoung

N1 - Funding Information: This work was supported by the Micro Thermal System Research Center, Seoul National University, sponsored by the Korean Science and Engineering Foundation.

PY - 2008

Y1 - 2008

N2 - A simple model of the electron effective mean free path (MFP) in thin metal films is proposed, and the thermal conductivities of aluminum and copper thin films are calculated by solving the Boltzmann transport equation (BTE). In the modeling of the electron effective MFP, the combined contributions of the bulk MFP and the film MFP are taken into account. The proposed effective electron MFP model is incorporated with the gray version of BTE through the "transport" relaxation time. The present model is verified against the experimental thermal conductivity data as a function of the film thickness.

AB - A simple model of the electron effective mean free path (MFP) in thin metal films is proposed, and the thermal conductivities of aluminum and copper thin films are calculated by solving the Boltzmann transport equation (BTE). In the modeling of the electron effective MFP, the combined contributions of the bulk MFP and the film MFP are taken into account. The proposed effective electron MFP model is incorporated with the gray version of BTE through the "transport" relaxation time. The present model is verified against the experimental thermal conductivity data as a function of the film thickness.

UR - https://www.scopus.com/pages/publications/43049137674

U2 - 10.1063/1.2917454

DO - 10.1063/1.2917454

M3 - Article

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JO - Applied Physics Letters

JF - Applied Physics Letters

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M1 - 171910

ER -

Electron effective mean free path and thermal conductivity predictions of metallic thin films

Abstract

Bibliographical note

ASJC Scopus subject areas

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