Emitting layer analysis of blue thermally activated delayed fluorescence devices using capacitance–voltage method

In this paper, blue thermally activated delayed fluorescence (TADF) organic light-emitting diodes (OLEDs) have been elucidated, with a focus on the degradation characteristics of the emission layer (EML). The operational stability against electrical stress was investigated for two host materials and four doping concentrations, which were used as the EML. The operating stability of the devices was confirmed by comparing the peak capacitance before and after degradation. Devices using bis [2-(diphenyl-phosphino) phenyl] ether oxide (DPEPO) as a host exhibited poor degradation characteristics. However, high stability was confirmed when 3,3-di (9H-carba-zol-9-yl)-biphenyl (mCBP) was used. DPEPO host devices are most resistant against performance degradation when they are doped with 10 wt% 10,10'-(4,4′-sulfonylbis(4,1-phenylene))bis(9,9-dimethyl-9,10-dihydroacridine (DMAC-DPS). We successfully determined the electroluminescence characteristics of the device depending on the host material, as well as the doping concentration, using the capacitance–voltage method.