Enhanced Microstructural Uniformity in Sulfuric-Acid-Treated Poly(3,4-Ethylenedioxythiophene):Poly(Styrene Sulfonate) Films Using Raman Map Analysis
- Hyewon Kim
- , Jiyeong Park
- , Jaehee Jang
- , Nurwarrohman Andre Sasongko
- , Jaeseong Heo
- , Songyi Lee
- , Kyungwon Kwak*
- , Seyoung Kee*
- , Myeongkee Park*
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
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