TY - GEN
T1 - Enhancing low-resolution facial images using error back-projection for human identification at a distance
AU - Park, Jeong Seon
AU - Lee, Seong Whan
PY - 2004
Y1 - 2004
N2 - This paper proposes a new method of enhancing the resolution of low-resolution facial images using an error back-projection method based on a top-down learning. A face is represented by a linear combination of prototypes of shape and texture. With the shape and texture information about the pixels in a given low-resolution facial image, we can estimate optimal coefficients for a linear combination of prototypes of shape and those of texture by solving least square minimization. Then high-resolution facial image can be obtained by using the optimal coefficients for linear combination of the high-resolution prototypes. In addition, an error back-projection procedure is applied to improve the accuracy of resolution enhancement.
AB - This paper proposes a new method of enhancing the resolution of low-resolution facial images using an error back-projection method based on a top-down learning. A face is represented by a linear combination of prototypes of shape and texture. With the shape and texture information about the pixels in a given low-resolution facial image, we can estimate optimal coefficients for a linear combination of prototypes of shape and those of texture by solving least square minimization. Then high-resolution facial image can be obtained by using the optimal coefficients for linear combination of the high-resolution prototypes. In addition, an error back-projection procedure is applied to improve the accuracy of resolution enhancement.
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U2 - 10.1109/ICPR.2004.1334123
DO - 10.1109/ICPR.2004.1334123
M3 - Conference contribution
AN - SCOPUS:10044276693
SN - 0769521282
T3 - Proceedings - International Conference on Pattern Recognition
SP - 346
EP - 349
BT - Proceedings of the 17th International Conference on Pattern Recognition, ICPR 2004
A2 - Kittler, J.
A2 - Petrou, M.
A2 - Nixon, M.
T2 - Proceedings of the 17th International Conference on Pattern Recognition, ICPR 2004
Y2 - 23 August 2004 through 26 August 2004
ER -