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Erratum: Improvements of defects by patterning using thermal nanoimprint lithography (Japanese Journal of Applied Physics (2007) 46 (1808))

  • Hyung Seok Park*
  • , Ho Hyun Shin
  • , Man Young Sung
  • , Woo Beom Choi
  • , Seung Woo Choi
  • , Sang Yong Park
  • *Corresponding author for this work

    Research output: Contribution to journalComment/debatepeer-review

    Original languageEnglish
    Article number079206
    JournalJapanese journal of applied physics
    Volume51
    Issue number7 PART 1
    DOIs
    Publication statusPublished - 2012 Jul

    ASJC Scopus subject areas

    • General Engineering
    • General Physics and Astronomy

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