Erratum: Proton irradiation energy dependence of dc and rf characteristics on InAlN/GaN high electron mobility transistors (Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures (2012) 30 (041206))

  • Chien Fong Lo
  • , Lu Liu
  • , Fan Ren*
  • , Stephen J. Pearton
  • , Brent P. Gila
  • , Hong Yeol Kim
  • , Jihyun Kim
  • , Oleg Laboutin
  • , Yu Cao
  • , Jerry W. Johnson
  • , Ivan I. Kravchenko
  • *Corresponding author for this work

    Research output: Contribution to journalComment/debatepeer-review

    Original languageEnglish
    Article number043401
    JournalJournal of Vacuum Science and Technology B:Nanotechnology and Microelectronics
    Volume30
    Issue number4
    DOIs
    Publication statusPublished - 2012 Jul

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Instrumentation
    • Process Chemistry and Technology
    • Surfaces, Coatings and Films
    • Electrical and Electronic Engineering
    • Materials Chemistry

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