@article{a0af664a5d054386bbcb5003ab6fc552,
title = "Erratum: Quantitative extraction of temperature-dependent barrier height and channel resistance of a-SIZO/OMO and a-SIZO/IZO thin-film transistors (IEEE Electron Device Letters (2013) 34: 2 (247-249) )",
author = "K. Heo and Hong, {B. H.} and Lee, {E. H.} and Lee, {S. Y.} and S. Kim and Hwang, {S. W.}",
year = "2013",
doi = "10.1109/LED.2013.2285072",
language = "English",
volume = "34",
pages = "1442",
journal = "IEEE Electron Device Letters",
issn = "0741-3106",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "11",
}