Erratum: Switching characterization and failure analysis of In 2Se 3 based phase change memory" (Japanese Journal of Applied Physics (2005) 44 (4759))

Heon Lee; Dae Hwan Kang

doi:10.1143/JJAP.51.089201

Erratum: Switching characterization and failure analysis of In ₂Se ₃ based phase change memory" (Japanese Journal of Applied Physics (2005) 44 (4759))

Heon Lee, Dae Hwan Kang

Department of Materials Science and Engineering

Research output: Contribution to journal › Comment/debate › peer-review

Original language	English
Article number	089201
Journal	Japanese journal of applied physics
Volume	51
Issue number	8 PART 1
DOIs	https://doi.org/10.1143/JJAP.51.089201
Publication status	Published - 2012 Aug

ASJC Scopus subject areas

Engineering(all)
Physics and Astronomy(all)

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10.1143/JJAP.51.089201

Cite this

@article{617306b88c544506b8977d03634cdcb8,

title = "Erratum: Switching characterization and failure analysis of In 2Se 3 based phase change memory{"} (Japanese Journal of Applied Physics (2005) 44 (4759))",

author = "Heon Lee and Kang, {Dae Hwan}",

year = "2012",

month = aug,

doi = "10.1143/JJAP.51.089201",

language = "English",

volume = "51",

journal = "Japanese journal of applied physics",

issn = "0021-4922",

publisher = "Japan Society of Applied Physics",

number = "8 PART 1",

}

TY - JOUR

T1 - Erratum

T2 - Switching characterization and failure analysis of In 2Se 3 based phase change memory" (Japanese Journal of Applied Physics (2005) 44 (4759))

AU - Lee, Heon

AU - Kang, Dae Hwan

PY - 2012/8

Y1 - 2012/8

UR - http://www.scopus.com/inward/record.url?scp=84864655631&partnerID=8YFLogxK

U2 - 10.1143/JJAP.51.089201

DO - 10.1143/JJAP.51.089201

M3 - Comment/debate

AN - SCOPUS:84864655631

SN - 0021-4922

VL - 51

JO - Japanese journal of applied physics

JF - Japanese journal of applied physics

IS - 8 PART 1

M1 - 089201

ER -

Erratum: Switching characterization and failure analysis of In 2Se 3 based phase change memory" (Japanese Journal of Applied Physics (2005) 44 (4759))

ASJC Scopus subject areas

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Erratum: Switching characterization and failure analysis of In ₂Se ₃ based phase change memory" (Japanese Journal of Applied Physics (2005) 44 (4759))