Erratum: Switching characterization and failure analysis of In 2Se 3 based phase change memory" (Japanese Journal of Applied Physics (2005) 44 (4759))

Heon Lee, Dae Hwan Kang

Research output: Contribution to journalComment/debatepeer-review

Original languageEnglish
Article number089201
JournalJapanese journal of applied physics
Issue number8 PART 1
Publication statusPublished - 2012 Aug

ASJC Scopus subject areas

  • General Engineering
  • General Physics and Astronomy

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