Abstract
We have developed a new pulsed laser deposition method for fabricating Er-doped silicon-rich silicon oxide (SRSO:Er) films. A target composed of a pure Si disk and an Er metal strip was ablated by a line-focused laser beam in oxygen atmosphere. The oxygen concentration that determines the relative concentrations of the three phases (Si-Si, SiOx, and SiO2) in the film was easily controlled by varying the ambient oxygen pressure. The photoluminescence intensity at 1.54 μm from Er3+ ions was strongly dependent on the amount of the Si-Si phase in the SRSO:Er films.
Original language | English |
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Pages (from-to) | 1541-1544 |
Number of pages | 4 |
Journal | Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers |
Volume | 43 |
Issue number | 4 A |
DOIs | |
Publication status | Published - 2004 Apr |
Keywords
- 1.54μm photoluminescence
- Er-doped silicon
- Pulsed laser deposition
ASJC Scopus subject areas
- General Engineering
- General Physics and Astronomy