Evaluation based on performance and failure of PV system in 10 years field-aged 1 MW PV power plant

Wonwook Oh, Hoonjoo Choi, Kun Won Seo, Daesung Kim, So Yeon Kim, Hae Seok Lee, Heon Hwang, Donghwan Kim

    Research output: Contribution to journalArticlepeer-review

    6 Citations (Scopus)

    Abstract

    PV (Photovoltaic) power systems have been rapidly installed and spreading worldwide in recent years. And there is a belief that the PV power plant will operate stably for more than 25 years. However, the PV modules have an unexpected failure. In this paper, we diagnosed a 10-year-old power plant using drone with infra-red (IR) camera, current-voltage (I-V) and electroluminescence (EL) measurement. The approximately 1 MW plant, consisting of two different PV modules, 200 W and 220 W, showed various failure modes. 59% PV modules failure caused an output loss, and an inverter with a serious loss is expected to degrade more than its annual degradation rate in PV strings above 40%. As a result, the power loss was quantitatively estimated to hot spot, bypass diode failure and degradation rate, and the capacity of the current PV system was evaluated at 88.3% and 93.2%.

    Original languageEnglish
    Article number113763
    JournalMicroelectronics Reliability
    Volume114
    DOIs
    Publication statusPublished - 2020 Nov

    Bibliographical note

    Funding Information:
    This research was supported by the Korea Institute of Energy Technology Evaluation and Planning (KETEP) and the Ministry of Trade, Industry and Energy (MOTIE) of the Republic of Korea (No. 20193020010390 ). Funding: This work was supported by the Ministry of Trade, Industry and Energy (MOTIE), Korea Institute for Advancement of Technology (KIAT) through the Encouragement Program for The Industries of Economic Cooperation Region ( P0002328 ).

    Publisher Copyright:
    © 2020 Elsevier Ltd

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Atomic and Molecular Physics, and Optics
    • Condensed Matter Physics
    • Safety, Risk, Reliability and Quality
    • Surfaces, Coatings and Films
    • Electrical and Electronic Engineering

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