We characterized the structural quality of CdTexSe1-x crystals grown by the Traveling Heater Method (THM) from a Te-rich solution using Synchrotron White Beam X-ray Diffraction Topography in the reflection mode. Structural defects were also studied by chemical etching of the crystal surfaces. The crystals were found to be fairly free from strains, and they had very few sub-grain boundaries and dislocation/sub-grain boundary networks.
Bibliographical noteFunding Information:
This work was supported by the U.S. Department of Energy , Office of Defense Nuclear Nonproliferation Research and Development , DNN R&D . The manuscript has been authored by Brookhaven Science Associates , LLC under Contract no. DE-AC02-98CH10886 with the U.S. Department of Energy.
- A1. Characterization
- A1. Extended defects
- A1. Sub-grain boundary network
- A2. THM
- B2. CdTeSe
- B2. Semiconducting II-VI materials
ASJC Scopus subject areas
- Condensed Matter Physics
- Inorganic Chemistry
- Materials Chemistry