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Evaluation of subsurface damage inherent to polished GaN substrates using depth-resolved cathodoluminescence spectroscopy
Jinhyung Lee, Jong Cheol Kim, Jongsik Kim, Rajiv K. Singh, Arul C. Arjunan*, Haigun Lee
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
19
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(Scopus)