Evaluation technology to verify flexible gas barrier property based on electrical calcium degradation for electronics application
- Ho Song Eun
- , Wook Park Young
- , Wook Jeong Jin
- , Hwan Choi Jin
- , Hyun Park Tae
- , Ju Choi Hyun
- , Kwon Ju Byeong
Research output: Contribution to conference › Paper › peer-review