Abstract
A new antiferromagnetic (AF) Mn-Ir-Pt film was fabricated as an exchange-biased layer (EBL). The exchange anisotropy and micro-structures of the fabricated EBL were characterized.
Original language | English |
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Pages (from-to) | EA-05 |
Journal | Digests of the Intermag Conference |
Publication status | Published - 2000 |
Externally published | Yes |
Event | 2000 IEEE International Magnetics Conference-2000 IEEE INTERMAG - Toronto, Ont, Can Duration: 2000 Apr 9 → 2000 Apr 13 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering