Abstract
A new antiferromagnetic (AF) Mn-Ir-Pt film was fabricated as an exchange-biased layer (EBL). The exchange anisotropy and micro-structures of the fabricated EBL were characterized.
| Original language | English |
|---|---|
| Pages (from-to) | EA-05 |
| Journal | Digests of the Intermag Conference |
| Publication status | Published - 2000 |
| Externally published | Yes |
| Event | 2000 IEEE International Magnetics Conference-2000 IEEE INTERMAG - Toronto, Ont, Can Duration: 2000 Apr 9 → 2000 Apr 13 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering