Experimental evidence of negative quantum capacitance in topological insulator for sub-60-mV/decade steep switching device

H. Choi, H. Lee, J. Park, H. Y. Yu, T. G. Kim, C. Shin

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    5 Citations (Scopus)

    Abstract

    As a three-dimensional topological insulator (TI), bismuth telluride (Bi2Te3) has two-dimensional electron gas on its surface where negative quantum capacitance (NQC) can exist at a specific biasing condition. In order to experimentally confirm NQC in a TI, a metal-insulator-semiconductor (MIS) capacitor (i.e., metal-Bi2Te3-SiO2-silicon) is fabricated. The capacitance-voltage measurement of the MIS capacitor at 300 K shows that as the depletion capacitance in silicon decreases, the total capacitance of the MIS capacitor, which consists of two capacitors connected in series (i.e., insulator capacitor and depletion capacitor), increases in the depletion region at a frequency of 50 kHz. The amplified capacitance indicates the existence of NQC on the surface of the TI, and it originates from the strongly correlated electron system. The NQC of the TI opens avenues for sub-60-mV/decade steep switching silicon devices.

    Original languageEnglish
    Article number203505
    JournalApplied Physics Letters
    Volume109
    Issue number20
    DOIs
    Publication statusPublished - 2016 Nov 14

    Bibliographical note

    Funding Information:
    This work was supported by the National Research Foundation of Korea (NRF) grant funded by the Korea government (MSIP) (Nos. 2014R1A2A1A11050637 and 2016R1A3B1908249). Also, this work was supported by the Future Semiconductor Device Technology Development Program (10067746) funded by the Ministry of Trade, Industry and Energy (MOTIE) and the Korea Semiconductor Research Consortium (KSRC)

    Publisher Copyright:
    © 2016 Author(s).

    ASJC Scopus subject areas

    • Physics and Astronomy (miscellaneous)

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