Extracting mobility degradation and total series resistance of cylindrical gate-all-around silicon nanowire field-effect transistors

Luryi Choi, Byoung Hak Hong, Young Chai Jung, Keun Hwi Cho, Kyoung Hwan Yeo, Dong Won Kim, Gyo Young Jin, Kyung Seok Oh, Won Seong Lee, Sang Hun Song, Jae Sung Rieh, Dong Mok Whang, Sung Woo Hwang

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9 Citations (Scopus)

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Engineering & Materials Science

Chemical Compounds