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Failure analysis of latent damage in low temperature poly-silicon TFT for OLED applications
Dong Sun Kim, Chun Bae Lim, Seung Won Jung, Du Seok Oh, Hyung Tae Kim, Won Joon Ho, Ju Young Jung, Jong Pil Shim, Tae Young Kim, Kwang S. Suh
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
6
Citations
(Scopus)