Abstract
This article focuses on optimization problems in military scenarios of the narrow-band Internet of Things (NB-IoT)-low Earth orbit (LEO) satellite networks. A 3D model of the LEO satellite is presented using a spherical coordinate system, enabling the determination of a practical elevation angle for the ground-to-satellite channel model. This study aims to maximize the minimum average throughput by formulating an optimization problem that incorporates the association between IoT devices and LEO satellites. To solve this problem, an iterative algorithm based on successive convex approximation algorithms is proposed. Simulation results confirm the effectiveness of the proposed optimal approach and show up to 59.51% of effective throughput improvement compared to conventional approaches while ensuring fairness between IoT devices. In addition, the article highlights important findings through top-view 2D and 3D snapshots, demonstrating optimal decisions using the proposed method.
Original language | English |
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Title of host publication | MILCOM 2023 - 2023 IEEE Military Communications Conference |
Subtitle of host publication | Communications Supporting Military Operations in a Contested Environment |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 957-962 |
Number of pages | 6 |
ISBN (Electronic) | 9798350321814 |
DOIs | |
Publication status | Published - 2023 |
Event | 2023 IEEE Military Communications Conference, MILCOM 2023 - Boston, United States Duration: 2023 Oct 30 → 2023 Nov 3 |
Publication series
Name | MILCOM 2023 - 2023 IEEE Military Communications Conference: Communications Supporting Military Operations in a Contested Environment |
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Conference
Conference | 2023 IEEE Military Communications Conference, MILCOM 2023 |
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Country/Territory | United States |
City | Boston |
Period | 23/10/30 → 23/11/3 |
Bibliographical note
Publisher Copyright:© 2023 IEEE.
ASJC Scopus subject areas
- Artificial Intelligence
- Computer Networks and Communications
- Signal Processing
- Safety, Risk, Reliability and Quality