False alarm classification for multivariate manufacturing processes of thin film transistor-liquid crystal displays

Control charts have been widely used to improve manufacturing processes by reducing variations and defects. In particular, multivariate control charts have been effectively applied with monitoring processes that contain many correlated variables. Most existing multivariate control charts are vulnerable to misclassification errors that originate because of the hypothesis tests. In particular, these often cause the generation of a large number of false alarms. In this paper, we propose a procedure to reduce false alarms by combining a multivariate control chart and data mining algorithms. Simulation and real case studies demonstrate that the proposed method effectively reduces the false alarm rate.