Abstract
We made a novel method for measuring far-field scattering distribution of single nanostructure with high signal-to-background ratio using total-internal-reflection illumination. We achieved wide measurement range by direct scanning over limit of numerical-aperture in conventional back-focal-imaging.
Original language | English |
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Title of host publication | 2015 11th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2015 |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Volume | 1 |
ISBN (Print) | 9781467371094 |
DOIs | |
Publication status | Published - 2016 Jan 7 |
Event | 11th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2015 - Busan, Korea, Republic of Duration: 2015 Aug 24 → 2015 Aug 28 |
Other
Other | 11th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2015 |
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Country/Territory | Korea, Republic of |
City | Busan |
Period | 15/8/24 → 15/8/28 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Atomic and Molecular Physics, and Optics