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Feature-learning-based printed circuit board inspection via speeded-up robust features and random forest
Eun Hye Yuk
, Seung Hwan Park
, Cheong Sool Park
,
Jun Geol Baek
*
*
Corresponding author for this work
School of Industrial Management Engineering
Research output
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Contribution to journal
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Article
›
peer-review
67
Citations (Scopus)
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Keyphrases
Learning-based
100%
Printed Circuit Board
100%
Random Forest
100%
Feature Learning
100%
Speeded up Robust Features
100%
Machine Learning
66%
Fault Pattern
66%
Weighted Kernel Density Estimation
66%
Production Process
33%
Defect Type
33%
Electronic Products
33%
Image Processing Techniques
33%
Extracting Features
33%
High-tech Products
33%
Inspection Technology
33%
Limit Method
33%
4th Industrial Revolution
33%
Engineering
Printed Circuit Board
100%
Random Forest
100%
Limitations
66%
Map Estimation
66%
Learning System
66%
Processing Technique
33%
Image Processing
33%
Electronic Product
33%
Inspection Technology
33%
Tech Product
33%