Ferroelectric and piezoelectric properties of 0.72Pb(Zr 0.47Ti 0.53)O 3-0.28Pb[(Zn 0.45Ni 0.55) 1/3Nb 2/3]O 3 thick films for energy harvesting device application

Young Hun Jeong, Kyoung Bum Kim, Young Jin Lee, Jeong Ho Cho, Byoung Ik Kim, Jong Hoo Paik, Sahn Nahm

Research output: Contribution to journalArticlepeer-review

15 Citations (Scopus)

Abstract

The Ferroelectric and piezoelectric properties of 0.72Pb(Zr 0.47Ti 0.53)O 3-0.28Pb[(Zn 0.45Ni 0.55) 1/3Nb 2/3]O 3 (PZT-PZNN) piezoelectric thick films were investigated for application to energy harvesting devices. The PZT-PZNN thick films were fabricated by a conventional tape casting process. The sintered PZT-PZNN thick film was highly dense and flat when the annealed temperature was 1100 °C. It exhibited substantial ferroelectric and piezoelectric properties of P r = 20.6 μC/cm 2, d 33 = 370 pC/N, ε T 33/ ε 0 = 1185, and k p = 0.44. Moreover, its d 33 · g 33, which can characterize high energy density material, is as large as approximately 13050 × 10 -15 m 2/N. Therefore, the PZT-PZNN thick film can be a potential piezoelectric material for application to energy harvesting devices.

Original languageEnglish
Article number09MD04
JournalJapanese journal of applied physics
Volume51
Issue number9 PART3
DOIs
Publication statusPublished - 2012 Sept

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

Fingerprint

Dive into the research topics of 'Ferroelectric and piezoelectric properties of 0.72Pb(Zr 0.47Ti 0.53)O 3-0.28Pb[(Zn 0.45Ni 0.55) 1/3Nb 2/3]O 3 thick films for energy harvesting device application'. Together they form a unique fingerprint.

Cite this