Abstract
A reliable nanofabrication on Au cluster films using an atomic force microscope (AFM) was presented. Noncontact mode of AFM equipped with W 2C coated tip was used. Field emission current amounting to ∼500 pA was observed. Dots and lines having widths as small as 50 nm were created.
Original language | English |
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Pages (from-to) | 1357-1360 |
Number of pages | 4 |
Journal | Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures |
Volume | 21 |
Issue number | 4 |
DOIs | |
Publication status | Published - 2003 |
ASJC Scopus subject areas
- Condensed Matter Physics
- Electrical and Electronic Engineering