Abstract
Field emission performance of boron nitride nanotube (BNNT) fabricated by simple filtration-transfer method, were evaluated according to vacuum pressure to estimate its potential use for robust electron sources. Even though there is little change in the current density-electric field characteristics, the stability test for a relatively long time shows somewhat large degradation at a vacuum pressure of over 10-5 Torr. To investigate a key factor of the degradation, we changed the vacuum ambient from air to argon. Under argon ambient condition, the current degradation and fluctuation rates were almost the same as those measured under air ambient at a vacuum pressure of 10-5 Torr. Consequently, ion bombardment dominantly induced the current degradation of the BNNT field emitters rather than oxidation effect.
Original language | English |
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Title of host publication | 2018 31st International Vacuum Nanoelectronics Conference, IVNC 2018 |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
ISBN (Electronic) | 9781538657171 |
DOIs | |
Publication status | Published - 2018 Nov 1 |
Event | 31st International Vacuum Nanoelectronics Conference, IVNC 2018 - Kyoto, Japan Duration: 2018 Jul 9 → 2018 Jul 13 |
Publication series
Name | 2018 31st International Vacuum Nanoelectronics Conference, IVNC 2018 |
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Other
Other | 31st International Vacuum Nanoelectronics Conference, IVNC 2018 |
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Country/Territory | Japan |
City | Kyoto |
Period | 18/7/9 → 18/7/13 |
Bibliographical note
Funding Information:ACKNOWLEDGMENT This work was supported by the Ministry of Science and ICT & the Ministry of Trade, Industry and Energy, Korea, through NRF (2015M3A9E2066999, 2017M2A2A6A020705 21), Nano-Convergence 2020 project (R201602910), and ETRI R&D program (18ZB1260).
Keywords
- Boron nitride nanotube
- cold cathode
- field emitter
- film emitter
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Industrial and Manufacturing Engineering
- Electronic, Optical and Magnetic Materials