Abstract
The electrical characteristics of a flexible nano-floating-gate memory (NFGM) device with a channel made of an enhancement-mode n +-p-n + Si nanowire (Si-NW) are investigated in this work. The NFGM based on the enhancement-mode Si-NW field-effect transistor is constructed on a plastic substrate with a Pt-nanocrystal floating-gate layer; it exhibits an on-current/off-current ratio of 10 7 and a subthreshold swing of 88 mV/dec. The NFGM shows good memory characteristics and mechanical flexibility, such as a threshold voltage shift of 1.85 V, a retention time of up to 10 4s, and a stability for up to 1000 bending cycles. The present study demonstrates the promising potential of flexible Si-NW-based nonvolatile memories for future electronics.
Original language | English |
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Article number | 6294439 |
Pages (from-to) | 2939-2942 |
Number of pages | 4 |
Journal | IEEE Transactions on Electron Devices |
Volume | 59 |
Issue number | 11 |
DOIs | |
Publication status | Published - 2012 |
Bibliographical note
Funding Information:Manuscript received May 2, 2012; revised July 1, 2012; accepted July 31, 2012. Date of publication September 4, 2012; date of current version October 18, 2012. This work was partly supported by the Nano R&D Program under Grant M10703000980-08M0300-98010, by the World-Class University Project of the Ministry of Education, Science, and Technology (Korea Science and Engineering Foundation) under Grant R32-2008-000-10082-0, by the Seoul R&BD Program under Grant PA090914, and by the KSSRC program (Development of printable integrated circuits based on inorganic semiconductor nanowires). The review of this paper was arranged by Editor G. Jeong.
Keywords
- Field-effect transistor (FET)
- Pt
- memory
- nanocrystal (NC)
- nonvolatile
- plastic substrate
- silicon-nanowire (Si-NW) array
- top-down approach
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering