Fluorite-to-Aurivillius phase transformation kinetics in sol-gel derived SBT thin films

Yun Mo Sung; Woo Chul Kwak

doi:10.1016/j.cplett.2005.06.071

Fluorite-to-Aurivillius phase transformation kinetics in sol-gel derived SBT thin films

Yun Mo Sung, Woo Chul Kwak

Department of Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

5 Citations (Scopus)

Abstract

SBT films with different thickness were fabricated using a sol-gel processing and spin coating. The as-coated films were heated at 600 °C for the crystallization to fluorite and then further heated at 740-770 °C for the phase transformation to Aurivillius. It was found that the phase transformation kinetics apparently increased with thickness up to ∼390 nm, and then it decreased above this value. The Johnson-Mehl-Avrami (JMA) isothermal kinetics analyses showed the dependence of nucleation and crystal growth modes on the film thickness. From the Arrhenius plots the activation energy values for the phase transformation were determined for SBT films with different thickness.

Original language	English
Pages (from-to)	389-394
Number of pages	6
Journal	Chemical Physics Letters
Volume	411
Issue number	4-6
DOIs	https://doi.org/10.1016/j.cplett.2005.06.071
Publication status	Published - 2005 Aug 15

ASJC Scopus subject areas

Physics and Astronomy(all)
Physical and Theoretical Chemistry

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title = "Fluorite-to-Aurivillius phase transformation kinetics in sol-gel derived SBT thin films",

abstract = "SBT films with different thickness were fabricated using a sol-gel processing and spin coating. The as-coated films were heated at 600 °C for the crystallization to fluorite and then further heated at 740-770 °C for the phase transformation to Aurivillius. It was found that the phase transformation kinetics apparently increased with thickness up to ∼390 nm, and then it decreased above this value. The Johnson-Mehl-Avrami (JMA) isothermal kinetics analyses showed the dependence of nucleation and crystal growth modes on the film thickness. From the Arrhenius plots the activation energy values for the phase transformation were determined for SBT films with different thickness.",

author = "Sung, {Yun Mo} and Kwak, {Woo Chul}",

note = "Funding Information: This work was supported by Korea Research Foundation Grant (KRF-2003-041-D20257).",

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doi = "10.1016/j.cplett.2005.06.071",

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AU - Sung, Yun Mo

AU - Kwak, Woo Chul

N1 - Funding Information: This work was supported by Korea Research Foundation Grant (KRF-2003-041-D20257).

PY - 2005/8/15

Y1 - 2005/8/15

N2 - SBT films with different thickness were fabricated using a sol-gel processing and spin coating. The as-coated films were heated at 600 °C for the crystallization to fluorite and then further heated at 740-770 °C for the phase transformation to Aurivillius. It was found that the phase transformation kinetics apparently increased with thickness up to ∼390 nm, and then it decreased above this value. The Johnson-Mehl-Avrami (JMA) isothermal kinetics analyses showed the dependence of nucleation and crystal growth modes on the film thickness. From the Arrhenius plots the activation energy values for the phase transformation were determined for SBT films with different thickness.

AB - SBT films with different thickness were fabricated using a sol-gel processing and spin coating. The as-coated films were heated at 600 °C for the crystallization to fluorite and then further heated at 740-770 °C for the phase transformation to Aurivillius. It was found that the phase transformation kinetics apparently increased with thickness up to ∼390 nm, and then it decreased above this value. The Johnson-Mehl-Avrami (JMA) isothermal kinetics analyses showed the dependence of nucleation and crystal growth modes on the film thickness. From the Arrhenius plots the activation energy values for the phase transformation were determined for SBT films with different thickness.

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JO - Chemical Physics Letters

JF - Chemical Physics Letters

IS - 4-6

ER -

Fluorite-to-Aurivillius phase transformation kinetics in sol-gel derived SBT thin films

Abstract

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