Abstract
The effect of Pt co-sputtering on the characteristics of amorphous V 2O5 films, grown by dc reactive sputtering, was investigated using glancing angle x-ray diffraction (GXRD), transmission electron microscopy (TEM), transmission electron diffraction (TED) and charge-discharge measurement. It was found that the Pt co-sputtering processes influence the growth mechanism as well as the characteristics of V 2O5 films. In addition, it was found that the Pt co-sputtered V2O5 cathode film exhibits cyclibility better than the undoped V2O5 cathode film, due to the absence of short range order, which is generally shown in undoped V2O 5 cathode films. Possible explanations for the cycling behavior of the Pt doped V2O5 cathode film and Pt co-sputtering effect on the electrochemical properties of thin film batteries are suggested.
Original language | English |
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Pages (from-to) | 135-140 |
Number of pages | 6 |
Journal | Metals and Materials International |
Volume | 9 |
Issue number | 2 |
DOIs | |
Publication status | Published - 2003 Apr |
Externally published | Yes |
Bibliographical note
Funding Information:This work was supported in part by National Research Laboratory project and Brain Korea 21 project. And one of the authors (Han-Ki Kim) gratefully acknowledges the discussion of Professor S. Berg of Uppsala University.
Keywords
- Cathode
- Pt co-sputtering
- Short-range order
- Thin film batteries
- Transmission electron microscopy (TEM)
- VO
ASJC Scopus subject areas
- Condensed Matter Physics
- Mechanics of Materials
- Metals and Alloys
- Materials Chemistry