The effect of Pt co-sputtering on the characteristics of amorphous V 2O5 films, grown by dc reactive sputtering, was investigated using glancing angle x-ray diffraction (GXRD), transmission electron microscopy (TEM), transmission electron diffraction (TED) and charge-discharge measurement. It was found that the Pt co-sputtering processes influence the growth mechanism as well as the characteristics of V 2O5 films. In addition, it was found that the Pt co-sputtered V2O5 cathode film exhibits cyclibility better than the undoped V2O5 cathode film, due to the absence of short range order, which is generally shown in undoped V2O 5 cathode films. Possible explanations for the cycling behavior of the Pt doped V2O5 cathode film and Pt co-sputtering effect on the electrochemical properties of thin film batteries are suggested.
Bibliographical noteFunding Information:
This work was supported in part by National Research Laboratory project and Brain Korea 21 project. And one of the authors (Han-Ki Kim) gratefully acknowledges the discussion of Professor S. Berg of Uppsala University.
- Pt co-sputtering
- Short-range order
- Thin film batteries
- Transmission electron microscopy (TEM)
ASJC Scopus subject areas
- Condensed Matter Physics
- Mechanics of Materials
- Metals and Alloys
- Materials Chemistry