Abstract
We grew CdTexSe1-x (CTS) crystals from a Te-rich solution by using the traveling heater method (THM). The average size distribution and concentration of Te inclusions/precipitates in these as-grown samples were measured to be ~7×104 cm-3, which is much lower than values typical for the present state-of-the-art commercial CdZnTe (CZT) material. Their low-temperature photoluminescence measurement indicates high quality of the material; however the resistivity obtained via I-V curve measurements was ~5×108 Ω-cm, which is low in comparison to that required for gamma detectors. A well-resolved alpha response peak can be detected for both planar- and hemispherical detector geometry. The (μτ)e value for our as-grown sample at room temperature was found to be ~4×10-3 cm2/V.
Original language | English |
---|---|
Pages (from-to) | 43-46 |
Number of pages | 4 |
Journal | Journal of Crystal Growth |
Volume | 386 |
DOIs | |
Publication status | Published - 2014 |
Externally published | Yes |
Bibliographical note
Funding Information:This work was supported by the U.S. Department of Energy , Office of Defense Nuclear Nonproliferation Research and development, DNN R&D. The manuscript has been authored by Brookhaven Science Associates, LLC under Contract no. DE-AC02-98CH10886 with the U.S. Department of Energy.
Keywords
- A1. Characterization
- A1. Defects
- A1. Te-inclusions
- A2. THM
- B2. CdTeSe
- B2. Semiconducting II-VI materials
ASJC Scopus subject areas
- Condensed Matter Physics
- Inorganic Chemistry
- Materials Chemistry