Growth of polycrystalline Cd0.8Zn0.2Te thick films for X-ray detectors

J. S. Kwon; D. Y. Shin; I. S. Choi; H. S. Kim; K. H. Kim; S. U. Kim; M. J. Park

doi:10.1002/1521-3951(200201)229:2<1097::AID-PSSB1097>3.0.CO;2-C

Growth of polycrystalline Cd_0.8Zn_0.2Te thick films for X-ray detectors

J. S. Kwon, D. Y. Shin, I. S. Choi, H. S. Kim, K. H. Kim, S. U. Kim, M. J. Park

School of Health and Environmental Science

Research output: Contribution to journal › Article › peer-review

8 Citations (Scopus)

Abstract

Cd_1-xZn_xTe is known as promising medical X-ray detector material but CdZnTe as a single crystal is not available in large sizes. As an alternative to single crystal, CdZnTe thick film was grown by vacuum thermal evaporator to 100 μm thickness. The characteristics of thick films were analyzed by XRD. EDS, SEM and current-voltage measurements. Zn composition is x = 0.2 and resistivity is higher than 10⁹ Ω cm.

Original language	English
Pages (from-to)	1097-1101
Number of pages	5
Journal	Physica Status Solidi (B) Basic Research
Volume	229
Issue number	2
DOIs	https://doi.org/10.1002/1521-3951(200201)229:2<1097::AID-PSSB1097>3.0.CO;2-C
Publication status	Published - 2002

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

Access to Document

10.1002/1521-3951(200201)229:2<1097::AID-PSSB1097>3.0.CO;2-C

Cite this

@article{a1368b79711c4941bf123ac33f5b08bb,

title = "Growth of polycrystalline Cd0.8Zn0.2Te thick films for X-ray detectors",

abstract = "Cd1-xZnxTe is known as promising medical X-ray detector material but CdZnTe as a single crystal is not available in large sizes. As an alternative to single crystal, CdZnTe thick film was grown by vacuum thermal evaporator to 100 μm thickness. The characteristics of thick films were analyzed by XRD. EDS, SEM and current-voltage measurements. Zn composition is x = 0.2 and resistivity is higher than 109 Ω cm.",

author = "Kwon, {J. S.} and Shin, {D. Y.} and Choi, {I. S.} and Kim, {H. S.} and Kim, {K. H.} and Kim, {S. U.} and Park, {M. J.}",

year = "2002",

doi = "10.1002/1521-3951(200201)229:2<1097::AID-PSSB1097>3.0.CO;2-C",

language = "English",

volume = "229",

pages = "1097--1101",

journal = "Physica Status Solidi (B): Basic Research",

issn = "0370-1972",

publisher = "Wiley-VCH Verlag",

number = "2",

}

TY - JOUR

T1 - Growth of polycrystalline Cd0.8Zn0.2Te thick films for X-ray detectors

AU - Kwon, J. S.

AU - Shin, D. Y.

AU - Choi, I. S.

AU - Kim, H. S.

AU - Kim, K. H.

AU - Kim, S. U.

AU - Park, M. J.

PY - 2002

Y1 - 2002

N2 - Cd1-xZnxTe is known as promising medical X-ray detector material but CdZnTe as a single crystal is not available in large sizes. As an alternative to single crystal, CdZnTe thick film was grown by vacuum thermal evaporator to 100 μm thickness. The characteristics of thick films were analyzed by XRD. EDS, SEM and current-voltage measurements. Zn composition is x = 0.2 and resistivity is higher than 109 Ω cm.

AB - Cd1-xZnxTe is known as promising medical X-ray detector material but CdZnTe as a single crystal is not available in large sizes. As an alternative to single crystal, CdZnTe thick film was grown by vacuum thermal evaporator to 100 μm thickness. The characteristics of thick films were analyzed by XRD. EDS, SEM and current-voltage measurements. Zn composition is x = 0.2 and resistivity is higher than 109 Ω cm.

UR - http://www.scopus.com/inward/record.url?scp=0036002045&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0036002045&partnerID=8YFLogxK

U2 - 10.1002/1521-3951(200201)229:2<1097::AID-PSSB1097>3.0.CO;2-C

DO - 10.1002/1521-3951(200201)229:2<1097::AID-PSSB1097>3.0.CO;2-C

M3 - Article

AN - SCOPUS:0036002045

SN - 0370-1972

VL - 229

SP - 1097

EP - 1101

JO - Physica Status Solidi (B): Basic Research

JF - Physica Status Solidi (B): Basic Research

IS - 2

ER -

Growth of polycrystalline Cd_0.8Zn_0.2Te thick films for X-ray detectors

Abstract

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this