Abstract
Epitaxial ZnO thin film was grown on spinel (111) substrates by using a hydrothermal technique. The phase and the surface morphology of the ZnO thin films were studied by using X-ray diffraction and field emission scanning electron microscopy. The as-grown film was c-axis oriented and had a rough pitted surface morphology. The thickness of the film was found to depend greatly on the initial precursor concentration. Room-temperature photoluminescence measurements were carried out to study the optical properties of the as-grown epitaxial ZnO thin films. Band edge luminescence due to excitonic recombination and deep-level emission peaks were observed.
Original language | English |
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Pages (from-to) | 313-316 |
Number of pages | 4 |
Journal | Journal of the Korean Physical Society |
Volume | 53 |
Issue number | 1 |
DOIs | |
Publication status | Published - 2008 Jul |
Externally published | Yes |
Keywords
- Epitaxial
- Hydrothermal
- Photoluminescence
- Single crystal
- X-ray diffraction
- ZnO
ASJC Scopus subject areas
- Physics and Astronomy(all)