Abstract
High-quality nonalloyed rhodium (Rh)-based ohmic contacts to p-type GaN were studied. The mechanisms for the ohmic contact formation without a post-annealing process were investigated using x-ray photoelectron microscopy (XPS). The results implied that Rh interacted with gallium and formed interfacial product such as gallides.
Original language | English |
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Pages (from-to) | 2372-2374 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 83 |
Issue number | 12 |
DOIs | |
Publication status | Published - 2003 Sept 22 |
Externally published | Yes |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)