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Highly efficient computer algorithm for identifying layer thickness of atomically thin 2D materials
Jekwan Lee, Seungwan Cho, Soohyun Park, Hyemin Bae, Minji Noh, Beom Kim, Chihun In, Seunghoon Yang, Sooun Lee, Seung Young Seo, Jehyun Kim, Chul Ho Lee, Woo Young Shim, Moon Ho Jo, Dohun Kim, Hyunyong Choi
Research output: Contribution to journal › Article › peer-review
6
Citations
(Scopus)