Keyphrases
Ag(III) Complex
50%
Annealing
100%
Bias Voltage
50%
Cm(III)
50%
Contact Layer
100%
Formation Mechanism
50%
Forward Bias
50%
High Transparency
100%
Injection Current
50%
Light Transmittance
50%
Light-emitting Diodes
100%
Low Resistance
50%
Ohmic
100%
Ohmic Contact
100%
P-GaN
100%
P-type Contact
50%
Photoemission Spectroscopy
50%
Sb Doping
50%
Scanning Electron Microscopy
50%
Specific Contact Resistance
50%
Ultraviolet Light-emitting Diode (UV-LED)
100%
Engineering
Bias Voltage
33%
Current Injection
33%
Forward Bias
33%
Highlight
33%
Light-Emitting Diode
100%
Ohmic Contacts
100%
Photoemission
33%
Ultraviolet Light
100%
Material Science
Annealing
33%
Contact Resistance
33%
Light-Emitting Diode
100%
Photoemission Spectroscopy
33%
Scanning Electron Microscopy
33%
Physics
Light Emitting Diode
100%
Photoelectric Emission
33%
Scanning Electron Microscopy
33%
Transmittance
33%