Image Synthesis with Single-type Patterns for Mixed-type Pattern Recognition on Wafer Bin Maps

Keyphrases

• Pattern Recognition 100%
• Labeled Data 100%
• Image Synthesis 100%
• Wafer Bin Map 100%
• Defect Pattern 100%
• Classification Model 66%
• Pattern Classification 33%
• Semiconductor Industry 33%
• Threshold Method 33%
• Manufacturing Process 33%
• Pixel-wise 33%
• Causal Factors 33%
• Classification Results 33%
• Binary pixel 33%
• Defect Classification 33%
• Defect Control 33%
• Deep Learning Model 33%
• Deep Convolutional Generative Adversarial Network (DCGAN) 33%
• Mixed-type Defects 33%
• Wafer Map 33%
• Deep Learning-based Classification 33%

Engineering

• Image Synthesis 100%
• Pattern Recognition 100%
• Deep Learning Method 100%
• Manufacturing Process 50%
• Domain Knowledge 50%