Imaging characterization of carbon nanotube tips modified using a focused ion beam

Young Hyun Shin; Jin Won Song; Eung Sug Lee; Chang Soo Han

doi:10.1016/j.apsusc.2007.01.135

Imaging characterization of carbon nanotube tips modified using a focused ion beam

Young Hyun Shin, Jin Won Song, Eung Sug Lee, Chang Soo Han

Research output: Contribution to journal › Article › peer-review

9 Citations (Scopus)

Abstract

A carbon nanotube (CNT) tip, which assembled on the sharp end of a Si tip by dielectrophoresis, was structurally modified using focused ion beam (FIB). We described the imaging characterization of the FIB-modified CNT tip in noncontact AFM mode in terms of wear, deep trench accessibility, and imaging resolution. Compared to a conventional Si tip, the FIB-modified CNT tip was superior, especially for prolonged scanning over 10 h. We conclude that modified CNT tips have the potential to obtain high-quality images of nanoscale structures.

Original language	English
Pages (from-to)	6872-6877
Number of pages	6
Journal	Applied Surface Science
Volume	253
Issue number	16
DOIs	https://doi.org/10.1016/j.apsusc.2007.01.135
Publication status	Published - 2007 Jun 15
Externally published	Yes

Bibliographical note

Funding Information:
We acknowledge the financial support of the Center for Nano Mechatronics & Manufacturing (CNMM) in MOST, Korea. The authors thank to FIB support of National NanoFab Center (NNFC).

Keywords

Atomic force microscopy
Carbon nanotube
Imaging
Wear

ASJC Scopus subject areas

General Chemistry
Condensed Matter Physics
General Physics and Astronomy
Surfaces and Interfaces
Surfaces, Coatings and Films

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10.1016/j.apsusc.2007.01.135

Cite this

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title = "Imaging characterization of carbon nanotube tips modified using a focused ion beam",

abstract = "A carbon nanotube (CNT) tip, which assembled on the sharp end of a Si tip by dielectrophoresis, was structurally modified using focused ion beam (FIB). We described the imaging characterization of the FIB-modified CNT tip in noncontact AFM mode in terms of wear, deep trench accessibility, and imaging resolution. Compared to a conventional Si tip, the FIB-modified CNT tip was superior, especially for prolonged scanning over 10 h. We conclude that modified CNT tips have the potential to obtain high-quality images of nanoscale structures.",

keywords = "Atomic force microscopy, Carbon nanotube, Imaging, Wear",

author = "Shin, {Young Hyun} and Song, {Jin Won} and Lee, {Eung Sug} and Han, {Chang Soo}",

note = "Funding Information: We acknowledge the financial support of the Center for Nano Mechatronics & Manufacturing (CNMM) in MOST, Korea. The authors thank to FIB support of National NanoFab Center (NNFC).",

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doi = "10.1016/j.apsusc.2007.01.135",

language = "English",

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journal = "Applied Surface Science",

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T1 - Imaging characterization of carbon nanotube tips modified using a focused ion beam

AU - Shin, Young Hyun

AU - Song, Jin Won

AU - Lee, Eung Sug

AU - Han, Chang Soo

N1 - Funding Information: We acknowledge the financial support of the Center for Nano Mechatronics & Manufacturing (CNMM) in MOST, Korea. The authors thank to FIB support of National NanoFab Center (NNFC).

PY - 2007/6/15

Y1 - 2007/6/15

N2 - A carbon nanotube (CNT) tip, which assembled on the sharp end of a Si tip by dielectrophoresis, was structurally modified using focused ion beam (FIB). We described the imaging characterization of the FIB-modified CNT tip in noncontact AFM mode in terms of wear, deep trench accessibility, and imaging resolution. Compared to a conventional Si tip, the FIB-modified CNT tip was superior, especially for prolonged scanning over 10 h. We conclude that modified CNT tips have the potential to obtain high-quality images of nanoscale structures.

AB - A carbon nanotube (CNT) tip, which assembled on the sharp end of a Si tip by dielectrophoresis, was structurally modified using focused ion beam (FIB). We described the imaging characterization of the FIB-modified CNT tip in noncontact AFM mode in terms of wear, deep trench accessibility, and imaging resolution. Compared to a conventional Si tip, the FIB-modified CNT tip was superior, especially for prolonged scanning over 10 h. We conclude that modified CNT tips have the potential to obtain high-quality images of nanoscale structures.

KW - Atomic force microscopy

KW - Carbon nanotube

KW - Imaging

KW - Wear

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DO - 10.1016/j.apsusc.2007.01.135

M3 - Article

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SN - 0169-4332

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SP - 6872

EP - 6877

JO - Applied Surface Science

JF - Applied Surface Science

IS - 16

ER -

Imaging characterization of carbon nanotube tips modified using a focused ion beam

Abstract

Bibliographical note

Keywords

ASJC Scopus subject areas

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