Imaging characterization of carbon nanotube tips modified using a focused ion beam

Young Hyun Shin, Jin Won Song, Eung Sug Lee, Chang Soo Han

Research output: Contribution to journalArticlepeer-review

9 Citations (Scopus)


A carbon nanotube (CNT) tip, which assembled on the sharp end of a Si tip by dielectrophoresis, was structurally modified using focused ion beam (FIB). We described the imaging characterization of the FIB-modified CNT tip in noncontact AFM mode in terms of wear, deep trench accessibility, and imaging resolution. Compared to a conventional Si tip, the FIB-modified CNT tip was superior, especially for prolonged scanning over 10 h. We conclude that modified CNT tips have the potential to obtain high-quality images of nanoscale structures.

Original languageEnglish
Pages (from-to)6872-6877
Number of pages6
JournalApplied Surface Science
Issue number16
Publication statusPublished - 2007 Jun 15
Externally publishedYes

Bibliographical note

Funding Information:
We acknowledge the financial support of the Center for Nano Mechatronics & Manufacturing (CNMM) in MOST, Korea. The authors thank to FIB support of National NanoFab Center (NNFC).


  • Atomic force microscopy
  • Carbon nanotube
  • Imaging
  • Wear

ASJC Scopus subject areas

  • General Chemistry
  • Condensed Matter Physics
  • General Physics and Astronomy
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films


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